New X-ray world record: Looking inside a microchip with 4 nanometer precision

In a collaboration with EPFL Lausanne, ETH Zurich and the University of Southern California researchers at the Paul Scherrer Institute PSI have used X-rays to look inside a microchip with higher precision than ever before. The image resolution of 4 nanometers marks a new world record. The high-resolution three-dimensional images of the type they produced will enable advances in both information technology and the life sciences.